Data-driven Bluetooth® LE development: Measuring what matters for connection stability and power efficiency

Gillian Minnehan from Nordic Semiconductor explores how Bluetooth® LE uses real-world data to improve connection stability, throughput, and battery life beyond what lab testing alone could reveal. It covers the key factors affecting performance and shares best practices for instrumenting fielded devices with metrics like disconnects, MTU size, and latency, illustrating through a practical example using Zephyr, Nordic Semiconductor, and Memfault.

Learn more on how to apply these insights to your own products.